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This unit tests digital systems and circuits based on TTL, CMOS, or ECL technologies. It generates clean and accurate pulses at up to 6 digits resolution with a repetition rate up to 50 MHz, variable pulse widths from 10ns to 10s, and pulse delays from 0ns to 10s. Output levels are adjustable from -10V to +10V, with pulse amplitudes settable from 0.1Vpp to 10Vpp into a 50 ohm load. All parameters, modes, and functions are programmable via the front panel or remote control commands.